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Thesis
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dc.contributor.author이경민en_US
dc.date.accessioned2015-02-25T13:35:30Z-
dc.date.available2015-02-25T13:35:30Z-
dc.date.issued2008en_US
dc.identifier.otherOAK-2015-06217en_US
dc.identifier.urihttp://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001909355en_US
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/8598-
dc.descriptionMasteren_US
dc.languagekoren_US
dc.publisher포항공과대학교en_US
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleTFT-LCD 패널의 결점 검출 방법en_US
dc.title.alternativeHybrid Defect Inspection Method for TFT-LCD Panelen_US
dc.typeThesisen_US
dc.contributor.college일반대학원 전자전기공학과en_US
dc.date.degree2008-02en_US

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