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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박찬언 | - |
| dc.date.accessioned | 2018-06-21T09:59:26Z | - |
| dc.date.available | 2018-06-21T09:59:26Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.date.issued | 2005-06-01 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/78959 | - |
| dc.relation.isPartOf | 발표논문집(3rd International Symposium of X-ray and Neutron Scattering on Integrated Molecular Syste | - |
| dc.relation.isPartOf | 발표논문집(3rd International Symposium of X-ray and Neutron Scattering on Integrated Molecular Syste | - |
| dc.title | The Effect of gate dielectric surface energy on pentacene morphology and OFET characteristics | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 발표논문집(3rd International Symposium of X-ray and Neutron Scattering on Integrated Molecular Syste | - |
| dc.citation.conferenceDate | 2005-06-27 | - |
| dc.citation.title | 발표논문집(3rd International Symposium of X-ray and Neutron Scattering on Integrated Molecular Syste | - |
| dc.contributor.affiliatedAuthor | 박찬언 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 박찬언PARK, CHAN EON
- Dept. of Chemical Enginrg