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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 제정호 | - |
| dc.date.accessioned | 2018-06-21T07:30:53Z | - |
| dc.date.available | 2018-06-21T07:30:53Z | - |
| dc.date.created | 2009-03-27 | - |
| dc.date.issued | 2003-01-01 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/77046 | - |
| dc.publisher | Materials Research Society | - |
| dc.relation.isPartOf | MRS Symp. Proc. | - |
| dc.relation.isPartOf | MRS Sympos Proc | - |
| dc.title | A structural analysis of the Pd/GaN ohmic contact annealing behavior | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | MRS Symp. Proc. | - |
| dc.citation.title | MRS Symp. Proc. | - |
| dc.contributor.affiliatedAuthor | 제정호 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 제정호JE, JUNG HO
- Dept of Materials Science & Enginrg