Full metadata record
DC Field | Value | Language |
dc.contributor.author | 이정수 | - |
dc.date.accessioned | 2018-06-19T01:41:03Z | - |
dc.date.available | 2018-06-19T01:41:03Z | - |
dc.date.created | 2015-12-30 | - |
dc.date.issued | 2015-07-01 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/70043 | - |
dc.publisher | NANO KOREA | - |
dc.relation.isPartOf | NANO KOREA 2015 Symposium | - |
dc.title | The Electrical Variations due to Grain Boundary using Voronoi Method in Tunneling Field-Effect-Transistor (TFET) of Polysilicon Nanowire Channel | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | NANO KOREA 2015 Symposium | - |
dc.citation.conferenceDate | 2015-07-01 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | NANO KOREA 2015 Symposium | - |
dc.contributor.affiliatedAuthor | 이정수 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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