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dc.contributor.author오상호-
dc.contributor.author박범수-
dc.contributor.author송경-
dc.date.accessioned2018-06-19T00:29:55Z-
dc.date.available2018-06-19T00:29:55Z-
dc.date.created2015-02-26-
dc.date.issued2014-11-16-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/68860-
dc.publisher대한금속재료학회-
dc.relation.isPartOfInternational Conference on Electronic Materials and Nanotechnology for Green Environment 2014-
dc.titleHigh-resolution 2-D strain analysis of SiGe/Si epitaxial layer systems-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationInternational Conference on Electronic Materials and Nanotechnology for Green Environment 2014-
dc.citation.conferencePlaceKO-
dc.citation.titleInternational Conference on Electronic Materials and Nanotechnology for Green Environment 2014-
dc.contributor.affiliatedAuthor오상호-
dc.contributor.affiliatedAuthor박범수-
dc.contributor.affiliatedAuthor송경-
dc.description.journalClass1-
dc.description.journalClass1-

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오상호OH, SANG HO
Dept of Materials Science & Enginrg
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