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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박홍준 | - |
| dc.contributor.author | 한승호 | - |
| dc.contributor.author | 이수은 | - |
| dc.contributor.author | 최민수 | - |
| dc.contributor.author | 심재윤 | - |
| dc.contributor.author | 김병섭 | - |
| dc.date.accessioned | 2018-06-18T12:28:23Z | - |
| dc.date.available | 2018-06-18T12:28:23Z | - |
| dc.date.created | 2015-02-11 | - |
| dc.date.issued | 2014-02-12 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/68104 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | 2014 IEEE International Solid-State Circuits Conference (ISSCC) | - |
| dc.title | A coefficient-error-robust FFE TX with 230% eye-variation improvement without calibration in 65nm CMOS technology | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2014 IEEE International Solid-State Circuits Conference (ISSCC) | - |
| dc.citation.title | 2014 IEEE International Solid-State Circuits Conference (ISSCC) | - |
| dc.contributor.affiliatedAuthor | 박홍준 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 박홍준PARK, HONG JUNE
- Dept of Electrical Enginrg