Effects of Microstructural Changes on Electrical Properties of Ti/Al based Ohmic Contacts on N-face n-GaN
- Title
- Effects of Microstructural Changes on Electrical Properties of Ti/Al based Ohmic Contacts on N-face n-GaN
- Authors
- 이종람; 김범준; 송양희; 손준호; 유학기
- Date Issued
- 2012-02-16
- Publisher
- 제 19회 반도체 학술대회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/60678
- Article Type
- Conference
- Citation
- 제 19회 반도체 학술대회, 2012-02-16
- Files in This Item:
- There are no files associated with this item.
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