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dc.contributor.author문원규-
dc.contributor.author신금재-
dc.contributor.author안태창-
dc.contributor.author임근배-
dc.contributor.author전종업-
dc.date.accessioned2018-06-18T03:02:39Z-
dc.date.available2018-06-18T03:02:39Z-
dc.date.created2012-03-19-
dc.date.issued2011-09-04-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/59929-
dc.publisherEurosensors XXV-
dc.relation.isPartOfProc. Eurosensors XXV-
dc.relation.isPartOfPROC. EUROSENSORS XXV-
dc.titleA FET mounted nano probe with a CNT for surface electrical properties-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationProc. Eurosensors XXV-
dc.citation.titleProc. Eurosensors XXV-
dc.contributor.affiliatedAuthor문원규-
dc.contributor.affiliatedAuthor신금재-
dc.contributor.affiliatedAuthor임근배-
dc.description.journalClass1-
dc.description.journalClass1-

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임근배LIM, GEUN BAE
Dept of Mechanical Enginrg
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