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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 임근배 | - |
| dc.date.accessioned | 2018-06-15T09:55:12Z | - |
| dc.date.available | 2018-06-15T09:55:12Z | - |
| dc.date.created | 2009-08-20 | - |
| dc.date.issued | 2006-11-12 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/54934 | - |
| dc.publisher | AVS | - |
| dc.relation.isPartOf | 53th AVS | - |
| dc.relation.isPartOf | 53th AVS | - |
| dc.title | A novel SPM probe with MOS transistor and nano tip for surface electric properties | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 53th AVS | - |
| dc.citation.conferenceDate | 2006-11-12 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | 53th AVS | - |
| dc.contributor.affiliatedAuthor | 임근배 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 임근배LIM, GEUN BAE
- Dept of Mechanical Enginrg