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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 강봉구 | - |
| dc.date.accessioned | 2018-06-15T07:48:06Z | - |
| dc.date.available | 2018-06-15T07:48:06Z | - |
| dc.date.created | 2009-08-13 | - |
| dc.date.issued | 1999-05-09 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/52788 | - |
| dc.publisher | The 4th International Symposium on Plasma Process-Induced Damage | - |
| dc.relation.isPartOf | The 4th International Symposium on Plasma Process-Induced Damage | - |
| dc.title | Effect of Low Temperature Deuterium Annealing on Plasma-Process Induced Damage | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | The 4th International Symposium on Plasma Process-Induced Damage | - |
| dc.citation.conferenceDate | 1999-05-09 | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | The 4th International Symposium on Plasma Process-Induced Damage | - |
| dc.contributor.affiliatedAuthor | 강봉구 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg