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Conference
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dc.contributor.author백록현-
dc.contributor.author홍승호-
dc.contributor.author최길복-
dc.contributor.author강희성-
dc.contributor.author정성우-
dc.contributor.author정윤하-
dc.date.accessioned2018-05-24T11:44:29Z-
dc.date.available2018-05-24T11:44:29Z-
dc.date.created2017-03-01-
dc.date.issued2007-06-25-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/49838-
dc.publisherIEICE-
dc.relation.isPartOfAWAD 2007-
dc.relation.isPartOfASIA-PACIFIC WORKSHOP ON FUNDAMENTALS AND APPLICATIONS OF ADVANCED SEMICONDUCTOR DEVICES-
dc.titleRF characteristics for 70 nm MOSFETs below 77K-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationAWAD 2007-
dc.citation.conferencePlaceKO-
dc.citation.titleAWAD 2007-
dc.contributor.affiliatedAuthor백록현-
dc.description.journalClass1-
dc.description.journalClass1-

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백록현BAEK, ROCK HYUN
Dept of Electrical Enginrg
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