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dc.contributor.author백록현-
dc.contributor.author최길복-
dc.contributor.author홍승호-
dc.contributor.author최현식-
dc.contributor.author이경택-
dc.contributor.author박민상-
dc.contributor.author송승현-
dc.contributor.author김재철-
dc.contributor.author사공현철-
dc.contributor.author강창용-
dc.contributor.author이병훈-
dc.contributor.authorG. Bersuker-
dc.contributor.authorH. H. Tseng-
dc.contributor.authorR. Jammy-
dc.contributor.author정성우-
dc.contributor.author정윤하-
dc.date.accessioned2018-05-24T11:44:26Z-
dc.date.available2018-05-24T11:44:26Z-
dc.date.created2017-03-01-
dc.date.issued2008-09-29-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/49837-
dc.publisherIEEE Device Society-
dc.relation.isPartOfISAGST 2008-
dc.relation.isPartOfINTERNATIONAL SYMPOSIUM ON ADVANCED GATE STACK TECHNOLOGY-
dc.titleNew multi frequency capacitance extraction methodology for leaky MOS capacitor with High-K dielectric and metal gate-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationISAGST 2008-
dc.citation.conferencePlaceUS-
dc.citation.titleISAGST 2008-
dc.contributor.affiliatedAuthor백록현-
dc.description.journalClass1-
dc.description.journalClass1-

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백록현BAEK, ROCK HYUN
Dept of Electrical Enginrg
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