Full metadata record
DC Field | Value | Language |
dc.contributor.author | 백록현 | - |
dc.contributor.author | 사공현철 | - |
dc.contributor.author | 이경택 | - |
dc.contributor.author | 최길복 | - |
dc.contributor.author | 최현식 | - |
dc.contributor.author | 송승현 | - |
dc.contributor.author | 박민상 | - |
dc.contributor.author | 이상현 | - |
dc.contributor.author | 정성우 | - |
dc.contributor.author | 정윤하 | - |
dc.date.accessioned | 2018-05-24T11:44:05Z | - |
dc.date.available | 2018-05-24T11:44:05Z | - |
dc.date.created | 2017-03-01 | - |
dc.date.issued | 2009-07-08 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49829 | - |
dc.publisher | 대한전자공학회 | - |
dc.relation.isPartOf | 대한전자공학회 하계학술대회 2009 | - |
dc.relation.isPartOf | PROCEEDINGS OF SEMICONDUCTOR SOCIETY, IEEK SUMMER CONFERENCE | - |
dc.title | RF degradation of short channel metal gate/high-k dielectric nMOSFET by hot carrier effect | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | 대한전자공학회 하계학술대회 2009 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.title | 대한전자공학회 하계학술대회 2009 | - |
dc.contributor.affiliatedAuthor | 백록현 | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
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