Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백록현 | - |
| dc.contributor.author | 김성호 | - |
| dc.contributor.author | 최도영 | - |
| dc.contributor.author | 사공현철 | - |
| dc.contributor.author | 정윤하 | - |
| dc.date.accessioned | 2018-05-24T11:43:57Z | - |
| dc.date.available | 2018-05-24T11:43:57Z | - |
| dc.date.created | 2017-03-01 | - |
| dc.date.issued | 2009-11-28 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49826 | - |
| dc.publisher | 대한전자공학회 | - |
| dc.relation.isPartOf | 대한전자공학회 추계학술대회 2009 | - |
| dc.relation.isPartOf | PROCEEDINGS OF SEMICONDUCTOR SOCIETY, IEEK FALL CONFERENCE | - |
| dc.title | Hot Electron Degradation Effects in 35nm InAlAs/InGaAs Metamorphic HEMT | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 대한전자공학회 추계학술대회 2009 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 대한전자공학회 추계학술대회 2009 | - |
| dc.contributor.affiliatedAuthor | 백록현 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg