Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정윤하 | - |
| dc.date.accessioned | 2018-05-23T15:50:10Z | - |
| dc.date.available | 2018-05-23T15:50:10Z | - |
| dc.date.created | 2010-09-09 | - |
| dc.date.issued | 2010-07-29 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/47116 | - |
| dc.publisher | 한국물리학회, IUPAP (세계물리학 국제연합) | - |
| dc.relation.isPartOf | International Conference on the Physics of Semiconductors (ICPS) | - |
| dc.relation.isPartOf | PROCEEDINGS OF INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS (ICPS) | - |
| dc.title | Low-Frequency Noise Analysis in HfO2/SiON Gate Stack nMOSFETs with Different Interfacial Layer Thickness | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | International Conference on the Physics of Semiconductors (ICPS), pp.1036 | - |
| dc.citation.conferenceDate | 2010-07-25 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.endPage | 1036 | - |
| dc.citation.startPage | 1036 | - |
| dc.citation.title | International Conference on the Physics of Semiconductors (ICPS) | - |
| dc.contributor.affiliatedAuthor | 정윤하 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg