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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김영환 | - |
| dc.contributor.author | 김재훈 | - |
| dc.contributor.author | 김욱 | - |
| dc.date.accessioned | 2018-05-23T14:46:47Z | - |
| dc.date.available | 2018-05-23T14:46:47Z | - |
| dc.date.created | 2010-05-06 | - |
| dc.date.issued | 2009-07-16 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/45949 | - |
| dc.publisher | Asia Symposium on Quality Electronic Design(Asqed) | - |
| dc.relation.isPartOf | Asia Symposium on Quality Electronic Design(Asqed) 2009 | - |
| dc.relation.isPartOf | ASIA SYMPOSIUM ON QUALITY ELECTRONIC DESIGN(ASQED) 2009 | - |
| dc.title | Effect of Local Random Variation on Gate-Level Delay and Leakage Statistical Analysis | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | Asia Symposium on Quality Electronic Design(Asqed) 2009 | - |
| dc.citation.conferenceDate | 2009-07-15 | - |
| dc.citation.title | Asia Symposium on Quality Electronic Design(Asqed) 2009 | - |
| dc.contributor.affiliatedAuthor | 김영환 | - |
| dc.contributor.affiliatedAuthor | 김재훈 | - |
| dc.contributor.affiliatedAuthor | 김욱 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 김영환KIM, YOUNG HWAN
- Dept of Electrical Enginrg