Conference
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Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박찬경 | - |
| dc.contributor.author | 구길호 | - |
| dc.date.accessioned | 2018-05-22T14:54:10Z | - |
| dc.date.available | 2018-05-22T14:54:10Z | - |
| dc.date.created | 2010-02-04 | - |
| dc.date.issued | 2009-11-30 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/43909 | - |
| dc.publisher | MRS fall meeting | - |
| dc.relation.isPartOf | MRS fall meeting | - |
| dc.title | Effects of Impurity Controlled Mo Under-layer on Reliability of Cu interconnector for TFT-LCD | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | MRS fall meeting | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | MRS fall meeting | - |
| dc.contributor.affiliatedAuthor | 박찬경 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg