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Department of Mechanical Engineering (기계공학과)
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Article
V-shaped metal-oxide-semiconductor transistor probe with nano tip for surface electric properties
SCIE
SCOPUS
ULTRAMICROSCOPY, vol. 108, no. 10, page. 1094 - 1100, 2008-09
Lee, SH
;
Lim, G
;
Moon, W
;
Shin, H
;
Kim, CW
1
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ATOMIC-FORCE MICROSCOPE
1
CANTILEVER
1
FILMS
1
focused ion beam
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metal-oxide-semiconductor transistor
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parallel beam approximation
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scanning probe microscopy
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V-shaped cantilever
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scie
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