DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, K | - |
dc.contributor.author | Park, JH | - |
dc.contributor.author | Kim, H | - |
dc.contributor.author | Kim, JK | - |
dc.contributor.author | Schubert, EF | - |
dc.contributor.author | Cho, J | - |
dc.date.accessioned | 2017-07-19T12:48:57Z | - |
dc.date.available | 2017-07-19T12:48:57Z | - |
dc.date.created | 2016-02-24 | - |
dc.date.issued | 2016-01-25 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/36488 | - |
dc.description.abstract | Indium tin oxide (ITO) thin films deposited using the oblique angle deposition (OAD) technique exhibit a strong correlation between structural and optical properties, especially the optical bandgap energy. The microstructural properties of ITO thin films are strongly influenced by the tilt angle used during the OAD process. When changing the tilt angle, the refractive index, porosity, and optical bandgap energy of ITO films also change due to the existence of a preferential growth direction at the interface between ITO and the substrate. Experiments reveal that the ITO film's optical bandgap varies from 3.98 eV (at normal incident deposition) to 3.87 eV (at a 60 degrees tilt angle). (C) 2016 AIP Publishing LLC. | - |
dc.language | English | - |
dc.publisher | AIP Publishing | - |
dc.relation.isPartOf | APPLIED PHYSICS LETTERS | - |
dc.subject | Photonic bandgap materials | - |
dc.subject | Refractive index | - |
dc.subject | Electron beam deposition | - |
dc.subject | Thin film growth | - |
dc.subject | X-ray diffraction | - |
dc.title | Energy bandgap variation in oblique angle-deposited indium tin oxide | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/1.4940998 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | APPLIED PHYSICS LETTERS, v.108, no.4, pp.41910 | - |
dc.identifier.wosid | 000375217200023 | - |
dc.date.tcdate | 2018-03-23 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 41910 | - |
dc.citation.title | APPLIED PHYSICS LETTERS | - |
dc.citation.volume | 108 | - |
dc.contributor.affiliatedAuthor | Kim, JK | - |
dc.identifier.scopusid | 2-s2.0-84957002397 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.scptc | 4 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.type.docType | Article | - |
dc.subject.keywordPlus | ITO THIN-FILMS | - |
dc.subject.keywordPlus | REFRACTIVE-INDEX | - |
dc.subject.keywordPlus | PHOTOVOLTAICS | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | ENHANCEMENT | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
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