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Cited 18 time in webofscience Cited 0 time in scopus
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dc.contributor.authorLee, SY-
dc.contributor.authorLee, YS-
dc.contributor.authorJeong, YH-
dc.date.accessioned2016-04-01T02:01:20Z-
dc.date.available2016-04-01T02:01:20Z-
dc.date.created2009-08-05-
dc.date.issued2006-01-
dc.identifier.issn0018-9480-
dc.identifier.other2006-OAK-0000005627-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/24236-
dc.description.abstractThis paper presents a novel measurement technique to measure the phases of intermodulation (IM) components of RF power amplifiers (PAs) with low-cost. This method can measure the phase distortions of the third-order IM components, as well as the fundamental signals generated in the PAs themselves by directly comparing the respective IM components before and after the PAs. A 45-W RF PA with an LDMOSFET in the wide-band code-division multiple-access band is implemented, and the relative changes of the IM phases of the PA are presented under various tone spacings, output power levels, and gate bias voltages. This system is very convenient for evaluating the memory effects of the PAs, and is helpful for the design of predistortion PAs and for the model extraction of PAs.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGI-
dc.relation.isPartOfIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES-
dc.subjectLDMOSFET-
dc.subjectmemory effects-
dc.subjectphase measurement-
dc.subjectpower amplifier (PA)-
dc.subjectsweet spots-
dc.subjecttwo-tone test-
dc.subjectPREDISTORTION-
dc.titleA novel phase measurement technique for IM3 components in RF power amplifiers-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1109/TMTT.2005.86-
dc.author.googleLee, SY-
dc.author.googleLee, YS-
dc.author.googleJeong, YH-
dc.relation.volume54-
dc.relation.issue1-
dc.relation.startpage451-
dc.relation.lastpage457-
dc.contributor.id10106021-
dc.relation.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.54, no.1, pp.451 - 457-
dc.identifier.wosid000234657600055-
dc.date.tcdate2019-01-01-
dc.citation.endPage457-
dc.citation.number1-
dc.citation.startPage451-
dc.citation.titleIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES-
dc.citation.volume54-
dc.contributor.affiliatedAuthorJeong, YH-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc13-
dc.type.docTypeArticle-
dc.subject.keywordAuthorLDMOSFET-
dc.subject.keywordAuthormemory effects-
dc.subject.keywordAuthorphase measurement-
dc.subject.keywordAuthorpower amplifier (PA)-
dc.subject.keywordAuthorsweet spots-
dc.subject.keywordAuthortwo-tone test-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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