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Cited 35 time in webofscience Cited 40 time in scopus
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dc.contributor.authorLee, J-
dc.contributor.authorKim, W-
dc.contributor.authorKim, Y-
dc.contributor.authorRho, T-
dc.contributor.authorKim, B-
dc.date.accessioned2016-03-31T13:58:23Z-
dc.date.available2016-03-31T13:58:23Z-
dc.date.created2009-03-18-
dc.date.issued1997-12-
dc.identifier.issn0018-9480-
dc.identifier.other1998-OAK-0000000011-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/20927-
dc.description.abstractThe intermodulation (IM) mechanism of heterojunction bipolar transistors (HBT's) has been studied by using an analytical nonlinear equivalent circuit model and Volterra-series analysis of the model, Although the third-order IM intercept point (IP3) does not depend-on the emitter parameter, it is appreciably affected by base and collector parameters and has been substantially improved by utilizing punchthrough collector structure. The measured IP3 of punchthrough collector HBT's is 31 dBm with 150-mW de power, which is higher than that of normal collector HBT's by 3 dB. The investigation of the cancellation effects of nonlinear elements reveals that the output nonlinear current components generated by emitter-base current source and base-collector current source cancel each other almost exactly, resulting in high linear characteristics of HBT's.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGI-
dc.relation.isPartOfIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES-
dc.subjectheterojunction bipolar transistors-
dc.subjectintermodulation distortion-
dc.subjectnonlinear distortion-
dc.subjectsemiconductor device modeling-
dc.subjectVolterra series-
dc.subjectHETEROJUNCTION BIPOLAR-TRANSISTORS-
dc.titleIntermodulation mechanism and linearization of AlGaAs/GaAs HBT's-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1109/22.643701-
dc.author.googleLee, J-
dc.author.googleKim, W-
dc.author.googleKim, Y-
dc.author.googleRho, T-
dc.author.googleKim, B-
dc.relation.volume45-
dc.relation.issue12-
dc.relation.startpage2065-
dc.relation.lastpage2072-
dc.contributor.id10106173-
dc.relation.journalIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.45, no.12, pp.2065 - 2072-
dc.identifier.wosid000071063600001-
dc.date.tcdate2019-01-01-
dc.citation.endPage2072-
dc.citation.number12-
dc.citation.startPage2065-
dc.citation.titleIEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES-
dc.citation.volume45-
dc.contributor.affiliatedAuthorKim, B-
dc.identifier.scopusid2-s2.0-0031375058-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc33-
dc.type.docTypeArticle-
dc.subject.keywordAuthorheterojunction bipolar transistors-
dc.subject.keywordAuthorintermodulation distortion-
dc.subject.keywordAuthornonlinear distortion-
dc.subject.keywordAuthorsemiconductor device modeling-
dc.subject.keywordAuthorVolterra series-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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김범만KIM, BUM MAN
Dept of Electrical Enginrg
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