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Cited 6 time in webofscience Cited 5 time in scopus
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dc.contributor.authorSun, CJ-
dc.contributor.authorChow, GM-
dc.contributor.authorSoo, EW-
dc.contributor.authorWang, JR-
dc.contributor.authorHwu, YK-
dc.contributor.authorCho, TS-
dc.contributor.authorJe, JH-
dc.contributor.authorLee, HH-
dc.contributor.authorKim, JW-
dc.contributor.authorNoh, DY-
dc.date.accessioned2016-03-31T13:08:48Z-
dc.date.available2016-03-31T13:08:48Z-
dc.date.created2009-02-28-
dc.date.issued2001-09-
dc.identifier.issn1533-4880-
dc.identifier.other2002-OAK-0000002515-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/19172-
dc.description.abstractThe effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co72Cr21Pt7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherAMER SCIENTIFIC PUBLISHERS-
dc.relation.isPartOfJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.subjectTi underlayer-
dc.subjectCoCrPt films-
dc.subjectXANES-
dc.subjectX-ray scattering-
dc.subjectMEDIA-
dc.titleStructural effects of Ti underlayer on CoCrPt magnetic films-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1166/JNN.2001.035-
dc.author.googleSun, CJ-
dc.author.googleChow, GM-
dc.author.googleSoo, EW-
dc.author.googleWang, JR-
dc.author.googleHwu, YK-
dc.author.googleCho, TS-
dc.author.googleJe, JH-
dc.author.googleLee, HH-
dc.author.googleKim, JW-
dc.author.googleNoh, DY-
dc.relation.volume1-
dc.relation.issue3-
dc.relation.startpage271-
dc.relation.lastpage273-
dc.contributor.id10123980-
dc.relation.journalJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.1, no.3, pp.271 - 273-
dc.identifier.wosid000174291500004-
dc.date.tcdate2019-01-01-
dc.citation.endPage273-
dc.citation.number3-
dc.citation.startPage271-
dc.citation.titleJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.citation.volume1-
dc.contributor.affiliatedAuthorJe, JH-
dc.identifier.scopusid2-s2.0-0038497730-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc4-
dc.description.scptc4*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthorTi underlayer-
dc.subject.keywordAuthorCoCrPt films-
dc.subject.keywordAuthorXANES-
dc.subject.keywordAuthorX-ray scattering-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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