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Cited 17 time in webofscience Cited 21 time in scopus
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dc.contributor.authorSong, JH-
dc.contributor.authorJeong, YH-
dc.date.accessioned2016-03-31T12:53:41Z-
dc.date.available2016-03-31T12:53:41Z-
dc.date.created2009-02-28-
dc.date.issued2003-03-
dc.identifier.issn0038-1098-
dc.identifier.other2003-OAK-0000003254-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/18642-
dc.description.abstractSrTiO3 homoepitaxy was investigated under various conditions using the pulsed laser deposition method. The growth mode was determined by in-situ reflection high-energy electron diffraction, and the surface of the films was characterized by ex-situ 2 atomic force microscopy. At the laser fluence of 0.68 J/cm(2), island growth was observed below 500degreesC substrate temperature, while the growth mode turned into layer-by-layer growth above 500degreesC. On further raising the substrate temperature, the step-flow growth mode prevailed above 800degreesC. We thus demonstrated that step-flow growth in SrTiO3 homoepitaxy is possible at a temperature as low as 800degreesC. (C) 2003 Elsevier Science Ltd. All rights reserved.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.relation.isPartOfSOLID STATE COMMUNICATIONS-
dc.subjectcrystal growth-
dc.subjectepitaxy-
dc.subjectlaser processing-
dc.subjectreflection high-energy electron diffraction-
dc.subjectTHIN-FILMS-
dc.subjectSURFACE-
dc.titleSrTiO3 homoepitaxy by the pulsed laser deposition method: island, layer-by-layer, and step-flow growth-
dc.typeArticle-
dc.contributor.college물리학과-
dc.identifier.doi10.1016/S0038-1098(03)00005-X-
dc.author.googleSong, JH-
dc.author.googleJeong, YH-
dc.relation.volume125-
dc.relation.issue10-
dc.relation.startpage563-
dc.relation.lastpage566-
dc.contributor.id10052189-
dc.relation.journalSOLID STATE COMMUNICATIONS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationSOLID STATE COMMUNICATIONS, v.125, no.10, pp.563 - 566-
dc.identifier.wosid000181506900010-
dc.date.tcdate2019-01-01-
dc.citation.endPage566-
dc.citation.number10-
dc.citation.startPage563-
dc.citation.titleSOLID STATE COMMUNICATIONS-
dc.citation.volume125-
dc.contributor.affiliatedAuthorJeong, YH-
dc.identifier.scopusid2-s2.0-0037370582-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc14-
dc.type.docTypeArticle-
dc.subject.keywordAuthorcrystal growth-
dc.subject.keywordAuthorepitaxy-
dc.subject.keywordAuthorlaser processing-
dc.subject.keywordAuthorreflection high-energy electron diffraction-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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