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dc.contributor.authorLee, SS-
dc.contributor.authorSong, HJ-
dc.contributor.authorChung, JW-
dc.date.accessioned2016-03-31T12:50:14Z-
dc.date.available2016-03-31T12:50:14Z-
dc.date.created2009-03-13-
dc.date.issued2003-06-01-
dc.identifier.issn0039-6028-
dc.identifier.other2003-OAK-0000003428-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/18513-
dc.description.abstractWe report the formation of Si(1 1 3)-3 x 2 facets upon exposing oxygens on the Si(5 5 12) surface at an elevated temperature. These facets are found to form only for a limited range of oxygen exposure and exhibit a well-defined 3 x 2 LEED pattern. We also find the surface electronic state unique only to the facets in the valence band. The spectral feature of these electronic states and the behavior of a (1/3 1/2) LEED spot upon oxygen contents in the facets indicate that the formation is a heterogeneous mixture of the clean Si(1 1 3) facets free of oxygens and other facets containing oxygen atoms. (C) 2003 Elsevier Science B.V. All rights reserved.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.relation.isPartOfSURFACE SCIENCE-
dc.subjectoxygen-
dc.subjectfaceting-
dc.subjectsilicon-
dc.subjectlow energy electron diffraction (LEED)-
dc.subjectangle resolved photoemission-
dc.subjectSI(100) SURFACES-
dc.subjectSI(111)-
dc.subjectGROWTH-
dc.subjectCHEMISORPTION-
dc.subjectDECOMPOSITION-
dc.subjectMICROSCOPY-
dc.subjectADSORPTION-
dc.subjectKINETICS-
dc.subjectSILICON-
dc.subjectLAYERS-
dc.titleFormation of oxygen-induced Si(113)-3 x 2 facets on the Si(5512) surface-
dc.typeArticle-
dc.contributor.college물리학과-
dc.identifier.doi10.1016/S0039-6028(0-
dc.author.googleLee, SS-
dc.author.googleSong, HJ-
dc.author.googleChung, JW-
dc.relation.volume531-
dc.relation.issue3-
dc.contributor.id10052578-
dc.relation.journalSURFACE SCIENCE-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationSURFACE SCIENCE, v.531, no.3, pp.L357 - L362-
dc.identifier.wosid000183254900001-
dc.date.tcdate2019-01-01-
dc.citation.endPageL362-
dc.citation.number3-
dc.citation.startPageL357-
dc.citation.titleSURFACE SCIENCE-
dc.citation.volume531-
dc.contributor.affiliatedAuthorChung, JW-
dc.identifier.scopusid2-s2.0-0038581164-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc1-
dc.type.docTypeArticle-
dc.subject.keywordPlusSI(100) SURFACES-
dc.subject.keywordPlusSI(111)-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusCHEMISORPTION-
dc.subject.keywordPlusDECOMPOSITION-
dc.subject.keywordPlusMICROSCOPY-
dc.subject.keywordPlusADSORPTION-
dc.subject.keywordPlusKINETICS-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusLAYERS-
dc.subject.keywordAuthoroxygen-
dc.subject.keywordAuthorfaceting-
dc.subject.keywordAuthorsilicon-
dc.subject.keywordAuthorlow energy electron diffraction (LEED)-
dc.subject.keywordAuthorangle resolved photoemission-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaPhysics-

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