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Cited 9 time in webofscience Cited 15 time in scopus
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dc.contributor.authorYu, D-
dc.contributor.authorLee, K-
dc.contributor.authorKim, B-
dc.contributor.authorOntiveros, D-
dc.contributor.authorVargason, K-
dc.contributor.authorKuo, JM-
dc.contributor.authorKao, YC-
dc.date.accessioned2016-03-31T12:48:24Z-
dc.date.available2016-03-31T12:48:24Z-
dc.date.created2009-02-28-
dc.date.issued2003-06-
dc.identifier.issn0741-3106-
dc.identifier.other2003-OAK-0000003530-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/18443-
dc.description.abstractInP-based single heterojunction bipolar transistors (SHBTs) for high-speed circuit applications were developed. Typical common emitter dc current gain (beta) and BVCEO were about 17 and 10 V, respectively. Maximum extrapolated f(max) of 478 GHZ with f(T) of 154 GHz was achieved for 0.5 x 10 mum(2) emitter size devices at 300 kA/cm(2) collector current density and 1.5 V collector bias. This is the highest f(max) ever reported for any nontransferred substrate HBTs, as far as the authors know. This paper highlights the optimized conventional process, and the authors have great hopes for the process that offers inherent advantages for the direct implementation to high-speed electronic circuit fabrication.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGI-
dc.relation.isPartOfIEEE ELECTRON DEVICE LETTERS-
dc.subjectbase-collector capacitance-
dc.subjectbase resistance-
dc.subjectheterojunction bipolar transistors (HBTs)-
dc.subjecthigh-speed devices-
dc.subjectALGAAS/GAAS HBTS-
dc.titleUltra high-speed InP-InGaAs SHBTs with f(max) of 478 GHz-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1109/LED.2003.813-
dc.author.googleYu, D-
dc.author.googleLee, K-
dc.author.googleKim, B-
dc.author.googleOntiveros, D-
dc.author.googleVargason, K-
dc.author.googleKuo, JM-
dc.author.googleKao, YC-
dc.relation.volume24-
dc.relation.issue6-
dc.relation.startpage384-
dc.relation.lastpage386-
dc.contributor.id10106173-
dc.relation.journalIEEE ELECTRON DEVICE LETTERS-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE ELECTRON DEVICE LETTERS, v.24, no.6, pp.384 - 386-
dc.identifier.wosid000184254700006-
dc.date.tcdate2019-01-01-
dc.citation.endPage386-
dc.citation.number6-
dc.citation.startPage384-
dc.citation.titleIEEE ELECTRON DEVICE LETTERS-
dc.citation.volume24-
dc.contributor.affiliatedAuthorKim, B-
dc.identifier.scopusid2-s2.0-0042091997-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc9-
dc.type.docTypeArticle-
dc.subject.keywordAuthorbase-collector capacitance-
dc.subject.keywordAuthorbase resistance-
dc.subject.keywordAuthorheterojunction bipolar transistors (HBTs)-
dc.subject.keywordAuthorhigh-speed devices-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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김범만KIM, BUM MAN
Dept of Electrical Enginrg
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