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Cited 24 time in webofscience Cited 24 time in scopus
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dc.contributor.authorWoo, J-
dc.contributor.authorLee, D-
dc.contributor.authorCha, E-
dc.contributor.authorLee, S-
dc.contributor.authorPark, S-
dc.contributor.authorHwang, H-
dc.date.accessioned2016-03-31T08:16:05Z-
dc.date.available2016-03-31T08:16:05Z-
dc.date.created2014-03-03-
dc.date.issued2013-12-
dc.identifier.issn0741-3106-
dc.identifier.other2013-OAK-0000029032-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/14928-
dc.description.abstractIn this letter, we discuss our technique for fabricating a vertically stacked ReRAM device composed of one selector and one resistor (1S-1R). We demonstrate that the nanoscale via-hole structure and 1-kb array architecture of selector device exhibit higher current density (similar to 10(7) A/cm(2)) and reliability, and we introduce bipolar resistive switching element-a conductive-bridge RAM that can be stacked on top of the selector device. The resulting integrated 1S-1R device performs robust bipolar switching operations and significantly reduces the leakage current in cross-point applications.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOfIEEE Electron Device Letters-
dc.subjectCross-point array architecture-
dc.subjectone selector and one resistor (1S-1R)-
dc.subjectselector device-
dc.subjectMEMORY-
dc.titleVertically Stacked ReRAM Composed of a Bidirectional Selector and CB-RAM for Cross-point Array Applications-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1109/LED.2013.2285583-
dc.author.googleWoo, J-
dc.author.googleLee, D-
dc.author.googleCha, E-
dc.author.googleLee, S-
dc.author.googlePark, S-
dc.author.googleHwang, H-
dc.relation.volume34-
dc.relation.issue12-
dc.relation.startpage1512-
dc.relation.lastpage1514-
dc.contributor.id10079928-
dc.relation.journalIEEE Electron Device Letters-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE Electron Device Letters, v.34, no.12, pp.1512 - 1514-
dc.identifier.wosid000327640400016-
dc.date.tcdate2019-01-01-
dc.citation.endPage1514-
dc.citation.number12-
dc.citation.startPage1512-
dc.citation.titleIEEE Electron Device Letters-
dc.citation.volume34-
dc.contributor.affiliatedAuthorHwang, H-
dc.identifier.scopusid2-s2.0-84889636339-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc15-
dc.description.scptc12*
dc.date.scptcdate2018-05-121*
dc.type.docTypeArticle-
dc.subject.keywordAuthorCross-point array architecture-
dc.subject.keywordAuthorone selector and one resistor (1S-1R)-
dc.subject.keywordAuthorselector device-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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