DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, HS | - |
dc.contributor.author | Park, HG | - |
dc.contributor.author | Kim, HT | - |
dc.contributor.author | Kim, KT | - |
dc.date.accessioned | 2016-03-31T07:43:53Z | - |
dc.date.available | 2016-03-31T07:43:53Z | - |
dc.date.created | 2015-02-04 | - |
dc.date.issued | 2014-03 | - |
dc.identifier.issn | 1349-2543 | - |
dc.identifier.other | 2014-OAK-0000031427 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/13951 | - |
dc.description.abstract | High-frequency predictions of radar cross-sections are usually performed using the well-known shooting and bouncing rays (SBR) method. SBR needs many incident ray tubes for accurate results. Therefore, its computation time is proportional to the square of the number of ray tubes, often resulting in a prohibitively large computation time, especially for electrically large and complex objects. To address this problem, a new ray tube merging scheme called line tracing SBR (LT-SBR) is proposed to reduce the number of incident rays. Simulation results reveal that the LT-SBR has a computational advantage over the conventional SBR and recently introduced beam tracing SBR. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | The Institute of Electronics, Information and Communication Engineers (IEICE) | - |
dc.relation.isPartOf | IEICE Electronics Express | - |
dc.title | Radar cross-section prediction based on shooting and bouncing rays using line tracing method | - |
dc.type | Article | - |
dc.contributor.college | 전자전기공학과 | - |
dc.identifier.doi | 10.1587/ELEX.11.20140102 | - |
dc.author.google | Lee, HS | - |
dc.author.google | Park, HG | - |
dc.author.google | Kim, HT | - |
dc.author.google | Kim, KT | - |
dc.relation.volume | 11 | - |
dc.relation.issue | 6 | - |
dc.contributor.id | 10086137 | - |
dc.relation.journal | IEICE ELECTRONICS EXPRESS | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCIE | - |
dc.collections.name | Journal Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | IEICE Electronics Express, v.11, no.6 | - |
dc.identifier.wosid | 000344827200008 | - |
dc.date.tcdate | 2018-03-23 | - |
dc.citation.number | 6 | - |
dc.citation.title | IEICE Electronics Express | - |
dc.citation.volume | 11 | - |
dc.contributor.affiliatedAuthor | Kim, HT | - |
dc.contributor.affiliatedAuthor | Kim, KT | - |
dc.identifier.scopusid | 2-s2.0-84897134776 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.scptc | 1 | * |
dc.date.scptcdate | 2018-05-121 | * |
dc.description.isOpenAccess | Y | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | RCS | - |
dc.subject.keywordAuthor | prediction | - |
dc.subject.keywordAuthor | SBR | - |
dc.subject.keywordAuthor | line | - |
dc.subject.keywordAuthor | tracing | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
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