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dc.contributor.authorBOULAIS, KA-
dc.contributor.authorCHOE, JY-
dc.contributor.authorCHOI, EH-
dc.contributor.authorCHUN, ST-
dc.contributor.authorNAMKUNG, W-
dc.date.accessioned2015-06-25T03:29:05Z-
dc.date.available2015-06-25T03:29:05Z-
dc.date.created2009-02-28-
dc.date.issued1993-04-
dc.identifier.issn0034-6748-
dc.identifier.other2015-OAK-0000008709en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/12780-
dc.description.abstractA novel system to measure the ratio of transverse velocity to axial velocity (alpha) of a low voltage, axis-rotating electron beam is described herein. With the system, more information about the beam can be obtained than from the usual slit/phosphor screen system. Since most of the beam is undisturbed before the phosphor screen, the beam radius and azimuthal symmetry can be quantified in combination with the beam alpha along various axial positions. The diagnostic is applied to a Cusptron microwave tube to measure these electron beam parameters which are important for high tube efficiency. Two magnetic field profiles are used to study various causes of low beam quality, while a third profile is used in attempt to maintain a high quality beam. By using the described system, it is shown that the third profile significantly increases beam quality. The system can easily be extended to higher energy beams with an appropriate scintillator.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleSYSTEM FOR VELOCITY RATIO MEASUREMENTS OF AN AXIS-ROTATING ELECTRON-BEAM-
dc.typeArticle-
dc.contributor.college물리학과en_US
dc.identifier.doi10.1063/1.1144149-
dc.author.googleBOULAIS, KAen_US
dc.author.googleCHOE, JYen_US
dc.author.googleNAMKUNG, Wen_US
dc.author.googleCHUN, STen_US
dc.author.googleCHOI, EHen_US
dc.relation.volume64en_US
dc.relation.startpage958en_US
dc.relation.lastpage961en_US
dc.contributor.id10184506en_US
dc.relation.journalREVIEW OF SCIENTIFIC INSTRUMENTSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.64, no.4, pp.958 - 961-
dc.identifier.wosidA1993KX40100019-
dc.citation.endPage961-
dc.citation.number4-
dc.citation.startPage958-
dc.citation.titleREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.citation.volume64-
dc.contributor.affiliatedAuthorNAMKUNG, W-
dc.identifier.scopusid2-s2.0-36449005828-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc0-
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaPhysics-

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