DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, HK | - |
dc.contributor.author | Kim, KJ | - |
dc.contributor.author | Han, JH | - |
dc.contributor.author | Kang, TH | - |
dc.contributor.author | Chung, JW | - |
dc.contributor.author | Kim, B | - |
dc.date.accessioned | 2015-06-25T03:05:33Z | - |
dc.date.available | 2015-06-25T03:05:33Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2008-03 | - |
dc.identifier.issn | 1098-0121 | - |
dc.identifier.other | 2015-OAK-0000007637 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/12191 | - |
dc.description.abstract | We have investigated adsorption of acetic acid on Si (100)-2x1 at room temperature using high-resolution photoemission spectroscopy and near edge x-ray adsorption fine structure (NEXAFS) measurements in the partial electron yield mode. At room temperature, an acetic-acid molecule is found to chemisorb on Si (100)-2x1 surface through the formation of the O-H dissociation structure. NEXAFS was conducted to characterize the adsorption geometry of acetic acid on Si (100). The pi* orbital of the C = O bond shows a good angle dependence in carbon K-edge NEXAFS spectra, and we estimate the adsorption angle between chemisorbed acetic acid of C = O bond and the Si (100) surface normal as similar to 41 degrees +/- 2 degrees using an analytical solution of NEXAFS intensity. | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | AMER PHYSICAL SOC | - |
dc.relation.isPartOf | PHYSICAL REVIEW B | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.title | Chemisorption of acetic acid on Si(100)-2x1 at room temperature | - |
dc.type | Article | - |
dc.contributor.college | 물리학과 | en_US |
dc.identifier.doi | 10.1103/PhysRevB.77.115324 | - |
dc.author.google | Lee, HK | en_US |
dc.author.google | Kim, KJ | en_US |
dc.author.google | Kim, B | en_US |
dc.author.google | Chung, JW | en_US |
dc.author.google | Kang, TH | en_US |
dc.author.google | Han, JH | en_US |
dc.relation.volume | 77 | en_US |
dc.relation.issue | 11 | en_US |
dc.contributor.id | 10052578 | en_US |
dc.relation.journal | PHYSICAL REVIEW B | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Journal Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | PHYSICAL REVIEW B, v.77, no.11 | - |
dc.identifier.wosid | 000254542800120 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.number | 11 | - |
dc.citation.title | PHYSICAL REVIEW B | - |
dc.citation.volume | 77 | - |
dc.contributor.affiliatedAuthor | Chung, JW | - |
dc.identifier.scopusid | 2-s2.0-41449088399 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 16 | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | HIGH-RESOLUTION PHOTOEMISSION | - |
dc.subject.keywordPlus | PHOTOELECTRON-SPECTROSCOPY | - |
dc.subject.keywordPlus | ADSORPTION | - |
dc.subject.keywordPlus | X-1 | - |
dc.subject.keywordPlus | SURFACE | - |
dc.subject.keywordPlus | ELECTRONICS | - |
dc.subject.keywordPlus | SELECTIVITY | - |
dc.subject.keywordPlus | MOLECULES | - |
dc.subject.keywordPlus | CHEMISTRY | - |
dc.subject.keywordPlus | BEAMLINE | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
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