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Cited 19 time in webofscience Cited 21 time in scopus
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dc.contributor.authorLee, HK-
dc.contributor.authorKim, KJ-
dc.contributor.authorHan, JH-
dc.contributor.authorKang, TH-
dc.contributor.authorChung, JW-
dc.contributor.authorKim, B-
dc.date.accessioned2015-06-25T03:05:33Z-
dc.date.available2015-06-25T03:05:33Z-
dc.date.created2009-02-28-
dc.date.issued2008-03-
dc.identifier.issn1098-0121-
dc.identifier.other2015-OAK-0000007637en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/12191-
dc.description.abstractWe have investigated adsorption of acetic acid on Si (100)-2x1 at room temperature using high-resolution photoemission spectroscopy and near edge x-ray adsorption fine structure (NEXAFS) measurements in the partial electron yield mode. At room temperature, an acetic-acid molecule is found to chemisorb on Si (100)-2x1 surface through the formation of the O-H dissociation structure. NEXAFS was conducted to characterize the adsorption geometry of acetic acid on Si (100). The pi* orbital of the C = O bond shows a good angle dependence in carbon K-edge NEXAFS spectra, and we estimate the adsorption angle between chemisorbed acetic acid of C = O bond and the Si (100) surface normal as similar to 41 degrees +/- 2 degrees using an analytical solution of NEXAFS intensity.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAMER PHYSICAL SOC-
dc.relation.isPartOfPHYSICAL REVIEW B-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleChemisorption of acetic acid on Si(100)-2x1 at room temperature-
dc.typeArticle-
dc.contributor.college물리학과en_US
dc.identifier.doi10.1103/PhysRevB.77.115324-
dc.author.googleLee, HKen_US
dc.author.googleKim, KJen_US
dc.author.googleKim, Ben_US
dc.author.googleChung, JWen_US
dc.author.googleKang, THen_US
dc.author.googleHan, JHen_US
dc.relation.volume77en_US
dc.relation.issue11en_US
dc.contributor.id10052578en_US
dc.relation.journalPHYSICAL REVIEW Ben_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationPHYSICAL REVIEW B, v.77, no.11-
dc.identifier.wosid000254542800120-
dc.date.tcdate2019-01-01-
dc.citation.number11-
dc.citation.titlePHYSICAL REVIEW B-
dc.citation.volume77-
dc.contributor.affiliatedAuthorChung, JW-
dc.identifier.scopusid2-s2.0-41449088399-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc16-
dc.type.docTypeArticle-
dc.subject.keywordPlusHIGH-RESOLUTION PHOTOEMISSION-
dc.subject.keywordPlusPHOTOELECTRON-SPECTROSCOPY-
dc.subject.keywordPlusADSORPTION-
dc.subject.keywordPlusX-1-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusELECTRONICS-
dc.subject.keywordPlusSELECTIVITY-
dc.subject.keywordPlusMOLECULES-
dc.subject.keywordPlusCHEMISTRY-
dc.subject.keywordPlusBEAMLINE-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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