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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | DONG, HWAN YANG | - |
| dc.contributor.author | ODONGO, FRANCIS NGOME OKELLO | - |
| dc.contributor.author | GO, KYOUNGJUNE | - |
| dc.contributor.author | 추유성 | - |
| dc.contributor.author | 한중훈 | - |
| dc.contributor.author | 양세정 | - |
| dc.contributor.author | CHOI, SI YOUNG | - |
| dc.date.accessioned | 2022-03-04T07:43:10Z | - |
| dc.date.available | 2022-03-04T07:43:10Z | - |
| dc.date.created | 2022-03-04 | - |
| dc.date.issued | 2021-11-11 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/110434 | - |
| dc.language | English | - |
| dc.publisher | The Korean Institute of Electrical and Electronic Material Engineers, 한국전기전자재료학회 | - |
| dc.relation.isPartOf | The 6th International Conference on Advanced Electromaterials(ICAE 2021) | - |
| dc.title | Deep learning investigated identification of point defects in monolayer 2H-MoTe2 | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | The 6th International Conference on Advanced Electromaterials(ICAE 2021) | - |
| dc.citation.conferenceDate | 2021-11-09 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | The 6th International Conference on Advanced Electromaterials(ICAE 2021) | - |
| dc.contributor.affiliatedAuthor | DONG, HWAN YANG | - |
| dc.contributor.affiliatedAuthor | ODONGO, FRANCIS NGOME OKELLO | - |
| dc.contributor.affiliatedAuthor | GO, KYOUNGJUNE | - |
| dc.contributor.affiliatedAuthor | CHOI, SI YOUNG | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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