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dc.contributor.authorNOH, YONG YOUNG-
dc.contributor.authorAO, LIU-
dc.contributor.authorHUIHUI, ZHU-
dc.date.accessioned2022-03-03T05:51:46Z-
dc.date.available2022-03-03T05:51:46Z-
dc.date.created2022-03-03-
dc.date.issued2021-08-26-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/110273-
dc.publisherThe Korean Information Display Society / The Society for Information Display-
dc.relation.isPartOfThe 21st International Meeting on Information Display (IMID 2021)-
dc.titleKey Roles of Trace Oxygen Treatment for High-Performance Zn-Doped CuI p-Channel Transistors-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationThe 21st International Meeting on Information Display (IMID 2021)-
dc.citation.conferenceDate2021-08-25-
dc.citation.conferencePlaceKO-
dc.citation.titleThe 21st International Meeting on Information Display (IMID 2021)-
dc.contributor.affiliatedAuthorNOH, YONG YOUNG-
dc.contributor.affiliatedAuthorAO, LIU-
dc.contributor.affiliatedAuthorHUIHUI, ZHU-
dc.description.journalClass1-
dc.description.journalClass1-

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