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dc.contributor.author성준영-
dc.contributor.authorJUNG, GYOO YEOL-
dc.contributor.author최웅-
dc.contributor.author신기원-
dc.contributor.author황희성-
dc.contributor.author박성필-
dc.contributor.author정규용-
dc.date.accessioned2021-12-05T11:45:35Z-
dc.date.available2021-12-05T11:45:35Z-
dc.date.created2021-11-23-
dc.date.issued2021-11-05-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/108196-
dc.publisher한국공업화학회-
dc.relation.isPartOf2021 한국공업화학회 추계 총회 및 학술대회-
dc.titlegenetic variation analysis by high resolution microchip-based CE-SSCP-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2021 한국공업화학회 추계 총회 및 학술대회-
dc.citation.conferenceDate2021-11-03-
dc.citation.conferencePlaceKO-
dc.citation.title2021 한국공업화학회 추계 총회 및 학술대회-
dc.contributor.affiliatedAuthor성준영-
dc.contributor.affiliatedAuthorJUNG, GYOO YEOL-
dc.description.journalClass2-
dc.description.journalClass2-

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정규열JUNG, GYOO YEOL
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