DC Field | Value | Language |
---|---|---|
dc.contributor.author | Parc, YW | - |
dc.contributor.author | Kim, C | - |
dc.contributor.author | Huang, JY | - |
dc.contributor.author | Ko, IS | - |
dc.date.accessioned | 2021-12-04T07:00:08Z | - |
dc.date.available | 2021-12-04T07:00:08Z | - |
dc.date.created | 2011-07-11 | - |
dc.date.issued | 2011-05 | - |
dc.identifier.issn | 0909-0495 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/108035 | - |
dc.description.abstract | The shapes of light sources such as electron beams can be reconstructed by inverse Fourier transformation of the complex degree of spatial coherency, which can be measured using Young's interferometer. The application of the phase-retrieval algorithm to reduce phase measurement errors in the complex degree of spatial coherency is numerically studied using an electron beam with an asymmetric distribution. This application is demonstrated with experimental data measured at the diagnostic beamline at the Pohang Accelerator Laboratory. | - |
dc.language | English | - |
dc.publisher | WILEY-BLACKWELL | - |
dc.relation.isPartOf | JOURNAL OF SYNCHROTRON RADIATION | - |
dc.title | Reconstruction of electron beam distribution using phase-retrieval algorithm | - |
dc.type | Article | - |
dc.identifier.doi | 10.1107/S0909049511004031 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF SYNCHROTRON RADIATION, v.18, pp.436 - 441 | - |
dc.identifier.wosid | 000291401900015 | - |
dc.citation.endPage | 441 | - |
dc.citation.startPage | 436 | - |
dc.citation.title | JOURNAL OF SYNCHROTRON RADIATION | - |
dc.citation.volume | 18 | - |
dc.contributor.affiliatedAuthor | Ko, IS | - |
dc.identifier.scopusid | 2-s2.0-79955562269 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | coherency | - |
dc.subject.keywordAuthor | interference | - |
dc.subject.keywordAuthor | electron beam | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
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