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Cited 16 time in webofscience Cited 16 time in scopus
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dc.contributor.authorSaddik, GN-
dc.contributor.authorSon, J-
dc.contributor.authorStemmer, S-
dc.contributor.authorYork, RA-
dc.date.accessioned2015-06-25T02:16:04Z-
dc.date.available2015-06-25T02:16:04Z-
dc.date.created2013-04-11-
dc.date.issued2011-05-01-
dc.identifier.issn0021-8979-
dc.identifier.other2015-OAK-0000027462en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10635-
dc.description.abstractTwo barium strontium titanate solidly mounted resonators with different bottom electrode surface roughnesses were fabricated and tested. The surface roughness of the bottom electrode was reduced by changing the deposition method of the SiO2 layer in the acoustic Bragg reflector in the solidly mounted resonator. The surface roughness was reduced from 2.81 nm RMS to 1.45 nm RMS. This reduction in the surface roughness contributed to a significant increase in the quality factor of the resonator. The quality factor for the device with a smooth platinum bottom electrode was 110 to 87 over a bias range of 5 to 40 V, and for the device with a rough platinum bottom electrode it was 1 to 31 over the same bias range. The effective electromechanical coupling coefficient was 4% at 40 V and 3.4% at 40 V for the smooth and rough platinum bottom electrodes, respectively. (C) 2011 American Institute of Physics. [doi:10.1063/1.3581204]-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherAmerican institute of physics-
dc.relation.isPartOfJournal of Applied Physics-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleImprovement of barium strontium titanate solidly mounted resonator quality factor by reduction in electrode surface roughness-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.3581204-
dc.author.googleSaddik, GNen_US
dc.author.googleSon, Jen_US
dc.author.googleYork, RAen_US
dc.author.googleStemmer, Sen_US
dc.relation.volume109en_US
dc.relation.issue9en_US
dc.contributor.id10138992en_US
dc.relation.journalJournal of Applied Physicsen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJournal of Applied Physics, v.109, no.9-
dc.identifier.wosid000290588500007-
dc.date.tcdate2019-01-01-
dc.citation.number9-
dc.citation.titleJournal of Applied Physics-
dc.citation.volume109-
dc.contributor.affiliatedAuthorSon, J-
dc.identifier.scopusid2-s2.0-79959517333-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc9-
dc.description.scptc12*
dc.date.scptcdate2018-10-274*
dc.type.docTypeArticle; Proceedings Paper-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-

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손준우SON, JUNWOO
Dept of Materials Science & Enginrg
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