Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE, JANG SIK | - |
| dc.date.accessioned | 2021-06-01T10:57:17Z | - |
| dc.date.available | 2021-06-01T10:57:17Z | - |
| dc.date.created | 2021-03-05 | - |
| dc.date.issued | 2020-01-20 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/106327 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | ICEIC 2020 | - |
| dc.title | Improvement of Device Reliability on Organic Memory Devices | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | ICEIC 2020 | - |
| dc.citation.conferenceDate | 2020-01-19 | - |
| dc.citation.conferencePlace | SP | - |
| dc.citation.title | ICEIC 2020 | - |
| dc.contributor.affiliatedAuthor | LEE, JANG SIK | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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