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dc.contributor.authorGO, KYOUNGJUNE-
dc.contributor.authorYANG, DONG-HWAN-
dc.contributor.authorJANG, JINHYUK-
dc.contributor.authorHAN, JUNGHUN-
dc.contributor.authorYANG, SEJUNG-
dc.contributor.authorCHOI, SI YOUNG-
dc.date.accessioned2021-06-01T05:27:13Z-
dc.date.available2021-06-01T05:27:13Z-
dc.date.created2021-03-04-
dc.date.issued2020-11-04-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/105714-
dc.publisherTHE KOREAN INSTITUTE OF METALS AND MATERIALS-
dc.relation.isPartOfThe 6th International Conference on Electronic Materials and Nanotechnology for Green Environment-
dc.titleDeep Learning Driven Pico-Metric Structural Analysis in Scanning Transmission Electron Microscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationThe 6th International Conference on Electronic Materials and Nanotechnology for Green Environment-
dc.citation.conferenceDate2020-11-01-
dc.citation.conferencePlaceKO-
dc.citation.titleThe 6th International Conference on Electronic Materials and Nanotechnology for Green Environment-
dc.contributor.affiliatedAuthorGO, KYOUNGJUNE-
dc.contributor.affiliatedAuthorYANG, DONG-HWAN-
dc.contributor.affiliatedAuthorJANG, JINHYUK-
dc.contributor.affiliatedAuthorCHOI, SI YOUNG-
dc.description.journalClass1-
dc.description.journalClass1-

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