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Cited 17 time in webofscience Cited 19 time in scopus
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dc.contributor.authorYoon, J-
dc.contributor.authorChoi, S-
dc.contributor.authorJin, S-
dc.contributor.authorJin, KS-
dc.contributor.authorHeo, K-
dc.contributor.authorRee, M-
dc.date.accessioned2015-06-25T02:07:11Z-
dc.date.available2015-06-25T02:07:11Z-
dc.date.created2009-02-28-
dc.date.issued2007-04-
dc.identifier.issn0021-8898-
dc.identifier.other2015-OAK-0000006812en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10423-
dc.description.abstractIn this study, we derive a grazing-incidence X-ray scattering (GIXS) formula to analyze quantitatively GIXS patterns for molecularly stacked layer structures in substrate-supported nanoscale thin films. We apply this formula in the quantitative analysis of GIXS patterns obtained for S-docosanylcysteine thin films on silicon substrates with native oxide layers. This analysis successfully provides information on the structural parameters and orientation of the molecular layer stack developed in S-docosanylcysteine thin films.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherBLACKWELL PUBLISHING-
dc.relation.isPartOfJOURNAL OF APPLIED CRYSTALLOGRAPHY-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleQuantitative analysis of molecularly stacked layer structures in supported organic thin films by synchrotron grazing-incidence X-ray scattering-
dc.typeArticle-
dc.contributor.college화학과en_US
dc.identifier.doi10.1107/S0021889806056056-
dc.author.googleYoon, Jen_US
dc.author.googleChoi, Sen_US
dc.author.googleRee, Men_US
dc.author.googleHeo, Ken_US
dc.author.googleJin, KSen_US
dc.author.googleJin, Sen_US
dc.relation.volume40en_US
dc.contributor.id10115761en_US
dc.relation.journalJOURNAL OF APPLIED CRYSTALLOGRAPHYen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameConference Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED CRYSTALLOGRAPHY, v.40, pp.S669 - S674-
dc.identifier.wosid000246059800136-
dc.date.tcdate2019-01-01-
dc.citation.endPageS674-
dc.citation.startPageS669-
dc.citation.titleJOURNAL OF APPLIED CRYSTALLOGRAPHY-
dc.citation.volume40-
dc.contributor.affiliatedAuthorRee, M-
dc.identifier.scopusid2-s2.0-34248324498-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc17-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordPlusORGANOSILICATE DIELECTRIC FILMS-
dc.subject.keywordPlusPARACRYSTALLINE DISTORTION-
dc.subject.keywordPlusLAMELLAR MICRODOMAINS-
dc.subject.keywordPlusBLOCK-COPOLYMER-
dc.subject.keywordPlusMODEL-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryCrystallography-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaCrystallography-

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Dept of Chemistry
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