DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoon, J | - |
dc.contributor.author | Choi, S | - |
dc.contributor.author | Jin, S | - |
dc.contributor.author | Jin, KS | - |
dc.contributor.author | Heo, K | - |
dc.contributor.author | Ree, M | - |
dc.date.accessioned | 2015-06-25T02:07:11Z | - |
dc.date.available | 2015-06-25T02:07:11Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2007-04 | - |
dc.identifier.issn | 0021-8898 | - |
dc.identifier.other | 2015-OAK-0000006812 | en_US |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/10423 | - |
dc.description.abstract | In this study, we derive a grazing-incidence X-ray scattering (GIXS) formula to analyze quantitatively GIXS patterns for molecularly stacked layer structures in substrate-supported nanoscale thin films. We apply this formula in the quantitative analysis of GIXS patterns obtained for S-docosanylcysteine thin films on silicon substrates with native oxide layers. This analysis successfully provides information on the structural parameters and orientation of the molecular layer stack developed in S-docosanylcysteine thin films. | - |
dc.description.statementofresponsibility | open | en_US |
dc.language | English | - |
dc.publisher | BLACKWELL PUBLISHING | - |
dc.relation.isPartOf | JOURNAL OF APPLIED CRYSTALLOGRAPHY | - |
dc.rights | BY_NC_ND | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.0/kr | en_US |
dc.title | Quantitative analysis of molecularly stacked layer structures in supported organic thin films by synchrotron grazing-incidence X-ray scattering | - |
dc.type | Article | - |
dc.contributor.college | 화학과 | en_US |
dc.identifier.doi | 10.1107/S0021889806056056 | - |
dc.author.google | Yoon, J | en_US |
dc.author.google | Choi, S | en_US |
dc.author.google | Ree, M | en_US |
dc.author.google | Heo, K | en_US |
dc.author.google | Jin, KS | en_US |
dc.author.google | Jin, S | en_US |
dc.relation.volume | 40 | en_US |
dc.contributor.id | 10115761 | en_US |
dc.relation.journal | JOURNAL OF APPLIED CRYSTALLOGRAPHY | en_US |
dc.relation.index | SCI급, SCOPUS 등재논문 | en_US |
dc.relation.sci | SCI | en_US |
dc.collections.name | Conference Papers | en_US |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF APPLIED CRYSTALLOGRAPHY, v.40, pp.S669 - S674 | - |
dc.identifier.wosid | 000246059800136 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | S674 | - |
dc.citation.startPage | S669 | - |
dc.citation.title | JOURNAL OF APPLIED CRYSTALLOGRAPHY | - |
dc.citation.volume | 40 | - |
dc.contributor.affiliatedAuthor | Ree, M | - |
dc.identifier.scopusid | 2-s2.0-34248324498 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 17 | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | ORGANOSILICATE DIELECTRIC FILMS | - |
dc.subject.keywordPlus | PARACRYSTALLINE DISTORTION | - |
dc.subject.keywordPlus | LAMELLAR MICRODOMAINS | - |
dc.subject.keywordPlus | BLOCK-COPOLYMER | - |
dc.subject.keywordPlus | MODEL | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Crystallography | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Crystallography | - |
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