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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KANG, BONG KOO | - |
| dc.contributor.author | Giyoun Roh | - |
| dc.contributor.author | Young-Kyu Kown | - |
| dc.contributor.author | Hyeok-Jin Kim | - |
| dc.date.accessioned | 2020-04-17T01:52:34Z | - |
| dc.date.available | 2020-04-17T01:52:34Z | - |
| dc.date.created | 2020-04-16 | - |
| dc.date.issued | 2019-09-24 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/103489 | - |
| dc.publisher | ESRF2019 | - |
| dc.relation.isPartOf | ESRF2019 | - |
| dc.relation.isPartOf | Microelectronics Reliability | - |
| dc.title | Characterization of Positive Bias Temperature Instability Concerning Interfacial Layer Thickness of HfSiON/SiO2 nMOSFET | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | ESRF2019 | - |
| dc.citation.conferenceDate | 2019-09-23 | - |
| dc.citation.conferencePlace | FR | - |
| dc.citation.title | ESRF2019 | - |
| dc.contributor.affiliatedAuthor | KANG, BONG KOO | - |
| dc.contributor.affiliatedAuthor | Hyeok-Jin Kim | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg