Full metadata record
DC Field | Value | Language |
dc.contributor.author | KIM, JONG KYU | - |
dc.date.accessioned | 2020-04-08T01:51:25Z | - |
dc.date.available | 2020-04-08T01:51:25Z | - |
dc.date.created | 2020-04-07 | - |
dc.date.issued | 2020-02-04 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/102653 | - |
dc.publisher | SPIE | - |
dc.relation.isPartOf | SPIE Photonics West 2020 | - |
dc.relation.isPartOf | SPIE Photonics West 2020 | - |
dc.title | Improvements in structural and optical properties of wafer-scale | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | SPIE Photonics West 2020 | - |
dc.citation.conferenceDate | 2020-02-01 | - |
dc.citation.conferencePlace | US | - |
dc.citation.title | SPIE Photonics West 2020 | - |
dc.contributor.affiliatedAuthor | KIM, JONG KYU | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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