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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | KIM, KWANG JAE | - |
| dc.contributor.author | CHOI, SEUNGHYUN | - |
| dc.contributor.author | LEE, CHANGHO | - |
| dc.contributor.author | LEE, DONGHEE | - |
| dc.date.accessioned | 2020-04-06T04:53:08Z | - |
| dc.date.available | 2020-04-06T04:53:08Z | - |
| dc.date.created | 2020-04-05 | - |
| dc.date.issued | 2019-08-24 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/102439 | - |
| dc.publisher | 한국품질경영학회 | - |
| dc.relation.isPartOf | The 18th China-Korea Bilateral Symposium on Quality | - |
| dc.relation.isPartOf | The 18th China-Korea Bilateral Symposium on Quality | - |
| dc.title | Detection and Classification of Spatial Patterns in Semiconductor Wafer Bin Maps: A Review of Recent Literature | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | The 18th China-Korea Bilateral Symposium on Quality | - |
| dc.citation.conferenceDate | 2019-08-23 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | Incheon | - |
| dc.citation.title | The 18th China-Korea Bilateral Symposium on Quality | - |
| dc.contributor.affiliatedAuthor | KIM, KWANG JAE | - |
| dc.contributor.affiliatedAuthor | CHOI, SEUNGHYUN | - |
| dc.contributor.affiliatedAuthor | LEE, CHANGHO | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 김광재KIM, KWANG JAE
- Dept. of Industrial & Management Eng.