DC Field | Value | Language |
---|---|---|
dc.contributor.author | Seo, J. | - |
dc.contributor.author | Kim, B. | - |
dc.date.accessioned | 2019-12-05T08:10:18Z | - |
dc.date.available | 2019-12-05T08:10:18Z | - |
dc.date.created | 2018-07-18 | - |
dc.date.issued | 2017-01 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/100363 | - |
dc.description.abstract | This paper analyzes effects of design parameters on the read margin of an ReRAM crossbar array. Because ReRAM's crossbar array suffers from small read margin, design parameters must be optimized for large read margin. In this paper, by simulating ReRAM crossbar arrays with various design parameters, we analyze the relations between the read margin and the design parameters: 1) the line resistor, 2) the sensing resistor, 3) the HRS and LRS resistances, and 4) the selectors. ? 2016 IEEE. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.relation.isPartOf | 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 | - |
dc.title | Read margin analysis in an ReRAM crossbar array | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/APCCAS.2016.7804006 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016, pp.473 - 475 | - |
dc.citation.endPage | 475 | - |
dc.citation.startPage | 473 | - |
dc.citation.title | 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016 | - |
dc.contributor.affiliatedAuthor | Kim, B. | - |
dc.identifier.scopusid | 2-s2.0-85011105591 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.type.docType | Conference Paper | - |
dc.subject.keywordAuthor | crossbar array | - |
dc.subject.keywordAuthor | read margin | - |
dc.subject.keywordAuthor | ReRAM | - |
dc.description.journalRegisteredClass | scopus | - |
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