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Browsing by AuthorYeohyeok Yun

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Conference

Analysis of Positive Bias Temperature Instability Degradation in n+ and p+ poly-Si Gates of High-Voltage SiO2 Dielectric nMOSFETs

IWDTF 2019, 2019-11-19

Conference

Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET

ESRF2019, 2019-09-24

Conference

Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress

the 29th European Symposium on Reliability of Electron Devices, 2018-10-02

Conference

Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability

European Symposium on Reliability of Electron Devices,Failure Physics and Analysis, 2018-10-02

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