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Article
Effects of single grain boundary and random interface traps on electrical variations of sub-30 nm polysilicon nanowire structuresSCIESCOPUS

MICROELECTRONIC ENGINEERING, vol. 149, page. 113 - 116, 2016-01-05

Article
Super-resolution visible photoactivated atomic force microscopySCIESCOPUS

Light-Science & Applications, vol. 6, 2017-11

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