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Issue DateTitle
1998-Jan

MICROELECTRONICS RELIABILITY, vol. 38, no. 1, page. 171 - 178, 1998-01

Mun, JK; Lee, JL; Kim, H; Lee, BT; Lee, JJ; Pyun, KE

1996-Jan

ELECTRONICS LETTERS, vol. 32, no. 17, page. 1533 - 1535, 1996-01

Youn, KJ; Kim, B; Lee, CS; Maeng, SJ; Lee, JJ; Pyun, KE; Park, HM

1996-Oct

JOURNAL OF APPLIED PHYSICS, vol. 80, no. 7, page. 3904 - 3909, 1996-10

Kwak, JS; Kim, HN; Baik, HK; Lee, JL; Shin, DW; Park, CG; Kim, H; Pyun, KE

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