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Browsing by AuthorIkho Lee
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Showing results 1 to 1 of 1
Article
Cost-Efficient and Automatic Large Volume Data Acquisition Method for On-Chip Random Process Variation Measurement
SCIE
SCOPUS
KCI
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, vol. 15, no. 2, page. 184 - 193, 2015-04
Sooeun Lee
;
Seungho Han
;
Ikho Lee
;
Sim, JY
;
Park, HJ
;
et al
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