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Browsing by  AuthorGang-Jun Kim

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Article
Channel width dependence of AC stress on bulk nMOSFETsSCIESCOPUS

Microelectronics Reliability, vol. 64, page. 194 - 198, 2016-09

Article
Degradation of pMOSFETs due to hot electron induced punchthroughSCIESCOPUS

Microelectronics Reliability, vol. 59, page. 13 - 17, 2016-04

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