Microelectronics Reliability, vol. 64, page. 194 - 198, 2016-09
Microelectronics Reliability, vol. 59, page. 13 - 17, 2016-04
the 29th European Symposium on Reliability of Electron Devices, 2018-10-02
European Symposium on Reliability of Electron Devices,Failure Physics and Analysis, 2018-10-02