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Browsing by AuthorChing-Te Chuang

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Conference

Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-K Metal Gate Technologies

IEEE International Reliability Physics Symposium (IRPS), page. 4.1 - 4.4, 2011-04-10

Article

Slew-Rate Monitoring Circuit for On-Chip Process Variation DetectionSCIESCOPUS

IEEE Transaction on VLSI, vol. 21, no. 9, page. 1683 - 1692, 2013-09

Article

SRAM Write-Ability Improvement with Transient Negative Bit-Line VoltageSCIESCOPUS

IEEE Trans. on VLSI Systems, vol. 19, no. 1, page. 24 - 32, 2011-01

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