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BAEK, ROCK HYUN(백록현) scopus

Department: Dept of Electrical Engineering(전자전기공학과)

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Publication & Time Cited Count (For the Last 5 years)

Results 1-9 of 9 (Search time: 0.001 seconds).

Article

Channel Trimming Process to Improve Electro-Thermal Characteristics for Sub-3-nm Node Si Nanosheet FETsSCIESCOPUS

IEEE Transactions on Electron Devices, vol. 71, no. 11, page. 7184 - 7191, 2024-11

Article

Neural Network-Based prediction for Cross-Temperature induced VT distribution shift in 3D NAND flash memorySCIESCOPUS

Solid-State Electronics, vol. 217, 2024-07

Article

Accurate Evaluation of Electro-Thermal Performance in Silicon Nanosheet Field-Effect Transistors with Schemes for Controlling Parasitic Bottom TransistorsSCIESCOPUS

Nanomaterials, vol. 14, no. 12, 2024-06

Article

Current-Voltage Modeling of DRAM Cell Transistor Using Genetic Algorithm and Deep LearningSCIESCOPUS

IEEE Access, vol. 12, page. 23881 - 23886, 2024-01

Article

Bidirectional Precharge and Negative Bias Scheme for Program Disturbance Suppression in 3-D NAND Flash MemorySCIESCOPUS

IEEE Transactions on Electron Devices, vol. 70, no. 12, page. 6313 - 6317, 2023-12

Article

Novel Scheme of Inner Spacer Length Optimization for Sub-3-nm Node Silicon n/p Nanosheet Field-Effect TransistorsSCIESCOPUS

IEEE Transactions on Electron Devices, vol. 70, no. 12, page. 6151 - 6156, 2023-12

Article

Investigation of Electrothermal Characteristics in Silicon Forksheet FETs for Sub-3-nm NodeSCIESCOPUS

IEEE Transactions on Electron Devices, vol. 70, no. 12, page. 6132 - 6137, 2023-12

Article

Modeling of 3D NAND Characteristics for Cross‐Temperature by Using Graph Neural Network and Its ApplicationSCIESCOPUS

Advanced Intelligent Systems, vol. 5, no. 12, 2023-12

Article

Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology DevelopmentSCIESCOPUS

Advanced Intelligent Systems, vol. 5, no. 9, 2023-09

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