MICROELECTRONIC ENGINEERING, vol. 182, page. 42 - 45, 2017-10
IEEE ELECTRON DEVICE LETTERS, vol. 38, no. 11, page. 1532 - 1535, 2017-09
ECS Journal of Solid State Science and Technology, vol. 6, no. 9, page. 641 - 643, 2017-09
IEEE ELECTRON DEVICE LETTERS, vol. 38, no. 9, page. 1220 - 1223, 2017-09
IEEE ELECTRON DEVICE LETTERS, vol. 38, no. 8, page. 1023 - 1026, 2017-08
APPLIED PHYSICS LETTERS, vol. 111, no. 6, 2017-08
ADVANCED MATERIALS, vol. 29, no. 30, 2017-08
ECS Journal of Solid State Science and Technology, vol. 6, no. 9, page. P586 - P588, 2017-08
Scientific Reports, vol. 7, 2017-06
IEEE ELECTRON DEVICE LETTERS, vol. 38, no. 6, page. 732 - 735, 2017-06
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, vol. 6, no. 7, page. 440 - 442, 2017-06
IEEE ELECTRON DEVICE LETTERS, vol. 38, no. 5, page. 568 - 571, 2017-05
IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 64, no. 11, page. 4763 - 4767, 2017-03
NANOTECHNOLOGY, vol. 28, no. 11, 2017-02
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, vol. 25, no. 6, page. 1821 - 1830, 2017-02
Nanoscale, vol. 9, no. 2, page. 582 - 593, 2017-01
Cognitive Systems Monographs, vol. 31, page. 129 - 149, 2017-01
Advances in Physics-x, vol. 2, no. 1, page. 89 - 124, 2017-01